Scanning Electron Microscope (SEM)

The scanning electron microscope (SEM) creates high magnification images by passing a beam of high-energy electrons over the surface an investigated material. This technology is widely used as an important tool for imaging material surfaces, as well as for identifying chemical signatures.

Key Features

• Common minerals and alloys can be rapidly identified by their unique chemical composition using EDX, without the need for special coatings or preparation.
• Capable of using secondary electrons and back-scattered electrons for imaging

Clients can access the SEM at the Advanced Microanalysis Centre™ on a fee-for-service basis at a rate of $160 per hour.

Click here to download the Sample Submission Form.

Contact the Advanced Microanalysis Centre™ to schedule your service.